Advances in Imaging and Electron Physics

The Scanning Transmission Electron Microscope

Nonfiction, Science & Nature, Technology, Electronics, Engineering, Computers, General Computing
Cover of the book Advances in Imaging and Electron Physics by Peter W. Hawkes, Elsevier Science
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Author: Peter W. Hawkes ISBN: 9780080961583
Publisher: Elsevier Science Publication: November 5, 2009
Imprint: Academic Press Language: English
Author: Peter W. Hawkes
ISBN: 9780080961583
Publisher: Elsevier Science
Publication: November 5, 2009
Imprint: Academic Press
Language: English
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.

Updated with contributions from leading international scholars and industry experts

Discusses hot topic areas and presents current and future research trends

Provides an invaluable reference and guide for physicists, engineers and mathematicians

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.

Updated with contributions from leading international scholars and industry experts

Discusses hot topic areas and presents current and future research trends

Provides an invaluable reference and guide for physicists, engineers and mathematicians

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