Advances in Imaging and Electron Physics

Nonfiction, Science & Nature, Science, Biological Sciences, Electron Microscopes & Microscopy, Molecular Physics
Cover of the book Advances in Imaging and Electron Physics by Peter W. Hawkes, Elsevier Science
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Author: Peter W. Hawkes ISBN: 9780128025192
Publisher: Elsevier Science Publication: August 21, 2015
Imprint: Academic Press Language: English
Author: Peter W. Hawkes
ISBN: 9780128025192
Publisher: Elsevier Science
Publication: August 21, 2015
Imprint: Academic Press
Language: English

Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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