Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Nonfiction, Science & Nature, Technology, Quality Control, Computers, Advanced Computing, Artificial Intelligence
Cover of the book Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou, Springer London
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou ISBN: 9780857293107
Publisher: Springer London Publication: March 28, 2011
Imprint: Springer Language: English
Author: Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
ISBN: 9780857293107
Publisher: Springer London
Publication: March 28, 2011
Imprint: Springer
Language: English

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.

To help readers cope with the increasing sophistication of FEMs’ applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will:

  • introduce the principle of FEMs;
  • review numerical modeling of ULSI interconnect reliability;
  • describe the physical mechanism of ULSI interconnect reliability encountered in the electronics industry; and
  • discuss in detail the use of FEMs to understand and improve ULSI interconnect reliability from both the physical and practical perspective, incorporating the Monte Carlo method.

A full-scale review of the numerical modeling methodology used in the study of interconnect reliability highlights useful and noteworthy techniques that have been developed recently. Many illustrations are used throughout the book to improve the reader’s understanding of the methodology and its verification. Actual experimental results and micrographs on ULSI interconnects are also included.

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections is a good reference for researchers who are working on interconnect reliability modeling, as well as for those who want to know more about FEMs for reliability applications. It gives readers a thorough understanding of the applications of FEM to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.

To help readers cope with the increasing sophistication of FEMs’ applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will:

A full-scale review of the numerical modeling methodology used in the study of interconnect reliability highlights useful and noteworthy techniques that have been developed recently. Many illustrations are used throughout the book to improve the reader’s understanding of the methodology and its verification. Actual experimental results and micrographs on ULSI interconnects are also included.

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections is a good reference for researchers who are working on interconnect reliability modeling, as well as for those who want to know more about FEMs for reliability applications. It gives readers a thorough understanding of the applications of FEM to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.

More books from Springer London

Cover of the book Embolization by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Neurorehabilitation Technology by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Reliability and Safety Engineering by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Sustainable Design by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Secure Information Management Using Linguistic Threshold Approach by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Toxic Trauma by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Fracture Classifications in Clinical Practice 2nd Edition by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Managing Cooperation in Supply Network Structures and Small or Medium-sized Enterprises by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book A Science of Operations by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Controversies in the Management of Gynecological Cancers by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Innovation Design by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Mine Safety by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Venous Embolization of the Liver by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Cover of the book Global Claims in Construction by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy