Atomic Force Microscopy

Understanding Basic Modes and Advanced Applications

Nonfiction, Science & Nature, Science, Other Sciences, Microscopes & Microscopy
Cover of the book Atomic Force Microscopy by Greg Haugstad, Wiley
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Author: Greg Haugstad ISBN: 9781118360682
Publisher: Wiley Publication: September 4, 2012
Imprint: Wiley Language: English
Author: Greg Haugstad
ISBN: 9781118360682
Publisher: Wiley
Publication: September 4, 2012
Imprint: Wiley
Language: English

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

“Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

“Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

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