by
Marise Bafleur, Fabrice Caignet, Nicolas Nolhier
Language: English
Release Date: July 26, 2017
Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the...