| Author: | Daniel Chateigner | ISBN: | 9781118622643 |
| Publisher: | Wiley | Publication: | March 4, 2013 |
| Imprint: | Wiley-ISTE | Language: | English |
| Author: | Daniel Chateigner |
| ISBN: | 9781118622643 |
| Publisher: | Wiley |
| Publication: | March 4, 2013 |
| Imprint: | Wiley-ISTE |
| Language: | English |
This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.
This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.
