Conductive Atomic Force Microscopy

Applications in Nanomaterials

Nonfiction, Science & Nature, Science, Chemistry, General Chemistry
Cover of the book Conductive Atomic Force Microscopy by , Wiley
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Author: ISBN: 9783527699797
Publisher: Wiley Publication: August 3, 2017
Imprint: Wiley-VCH Language: English
Author:
ISBN: 9783527699797
Publisher: Wiley
Publication: August 3, 2017
Imprint: Wiley-VCH
Language: English

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

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