Confocal Microscopy

Nonfiction, Science & Nature, Science, Biological Sciences, Electron Microscopes & Microscopy, Other Sciences, Microscopes & Microscopy, Molecular Physics
Cover of the book Confocal Microscopy by Jian Liu, Jiubin Tan, Morgan & Claypool Publishers
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Author: Jian Liu, Jiubin Tan ISBN: 9781681743387
Publisher: Morgan & Claypool Publishers Publication: December 21, 2016
Imprint: IOP Concise Physics Language: English
Author: Jian Liu, Jiubin Tan
ISBN: 9781681743387
Publisher: Morgan & Claypool Publishers
Publication: December 21, 2016
Imprint: IOP Concise Physics
Language: English

The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.

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The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.

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