Contactless VLSI Measurement and Testing Techniques

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Advanced Computing, Engineering, Computer Architecture
Cover of the book Contactless VLSI Measurement and Testing Techniques by Selahattin Sayil, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Selahattin Sayil ISBN: 9783319696737
Publisher: Springer International Publishing Publication: November 16, 2017
Imprint: Springer Language: English
Author: Selahattin Sayil
ISBN: 9783319696737
Publisher: Springer International Publishing
Publication: November 16, 2017
Imprint: Springer
Language: English

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.

More books from Springer International Publishing

Cover of the book Free Boundary Problems in PDEs and Particle Systems by Selahattin Sayil
Cover of the book Leveraged Exchange-Traded Funds by Selahattin Sayil
Cover of the book Overcoming Workplace Pathologies by Selahattin Sayil
Cover of the book Integrated History and Philosophy of Science by Selahattin Sayil
Cover of the book Applications in Electronics Pervading Industry, Environment and Society by Selahattin Sayil
Cover of the book Energy Efficient Smart Phones for 5G Networks by Selahattin Sayil
Cover of the book Progressive Business Models by Selahattin Sayil
Cover of the book Tumors of the Sacrum by Selahattin Sayil
Cover of the book University Evolution, Entrepreneurial Activity and Regional Competitiveness by Selahattin Sayil
Cover of the book Active Fault-Tolerant Control Systems by Selahattin Sayil
Cover of the book Topics in Theoretical Computer Science by Selahattin Sayil
Cover of the book Artificial Neural Networks and Machine Learning – ICANN 2018 by Selahattin Sayil
Cover of the book The Changing Role of the Management Accountants by Selahattin Sayil
Cover of the book Lecture Notes in Real-Time Intelligent Systems by Selahattin Sayil
Cover of the book The Flipped College Classroom by Selahattin Sayil
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy