Digital Holography for MEMS and Microsystem Metrology

Nonfiction, Science & Nature, Technology, Electronics, Microelectronics
Cover of the book Digital Holography for MEMS and Microsystem Metrology by Anand Asundi, Wiley
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Anand Asundi ISBN: 9781119972785
Publisher: Wiley Publication: July 5, 2011
Imprint: Wiley Language: English
Author: Anand Asundi
ISBN: 9781119972785
Publisher: Wiley
Publication: July 5, 2011
Imprint: Wiley
Language: English

Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes.

  • Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies.
  • Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications.
  • Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging.
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes.

More books from Wiley

Cover of the book Congo by Anand Asundi
Cover of the book Capital Structure Decisions by Anand Asundi
Cover of the book Handbook of Nonresponse in Household Surveys by Anand Asundi
Cover of the book Chest X-rays for Medical Students by Anand Asundi
Cover of the book Perl and Apache by Anand Asundi
Cover of the book Calculus For Dummies by Anand Asundi
Cover of the book Raspberry Pi für Dummies by Anand Asundi
Cover of the book Locke by Anand Asundi
Cover of the book No Boundaries by Anand Asundi
Cover of the book Cardiology for Veterinary Technicians and Nurses by Anand Asundi
Cover of the book The Tax Law of Charitable Giving, 2018 Cumulative Supplement by Anand Asundi
Cover of the book The Good Parenting Food Guide by Anand Asundi
Cover of the book Interpretation of MS-MS Mass Spectra of Drugs and Pesticides by Anand Asundi
Cover of the book Integrating Expressive Arts and Play Therapy with Children and Adolescents by Anand Asundi
Cover of the book Evaluation and Facilitation by Anand Asundi
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy