Field Emission Scanning Electron Microscopy
New Perspectives for Materials Characterization
Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Material Science
| Author: | Nicolas Brodusch, Hendrix Demers, Raynald Gauvin | ISBN: | 9789811044335 |
| Publisher: | Springer Singapore | Publication: | September 25, 2017 |
| Imprint: | Springer | Language: | English |
| Author: | Nicolas Brodusch, Hendrix Demers, Raynald Gauvin |
| ISBN: | 9789811044335 |
| Publisher: | Springer Singapore |
| Publication: | September 25, 2017 |
| Imprint: | Springer |
| Language: | English |
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
