High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Computer Hardware, Input-Output Equipment
| Author: | Zheng Wang, Anupam Chattopadhyay | ISBN: | 9789811010736 |
| Publisher: | Springer Singapore | Publication: | June 23, 2017 |
| Imprint: | Springer | Language: | English |
| Author: | Zheng Wang, Anupam Chattopadhyay |
| ISBN: | 9789811010736 |
| Publisher: | Springer Singapore |
| Publication: | June 23, 2017 |
| Imprint: | Springer |
| Language: | English |
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
