Local Electrode Atom Probe Tomography
A User's Guide
Nonfiction, Science & Nature, Science, Other Sciences, Nanostructures, Technology, Material Science
| Author: | David J. Larson, Robert M. Ulfig, Brian P. Geiser, Ty J. Prosa, Thomas F. Kelly | ISBN: | 9781461487210 |
| Publisher: | Springer New York | Publication: | December 12, 2013 |
| Imprint: | Springer | Language: | English |
| Author: | David J. Larson, Robert M. Ulfig, Brian P. Geiser, Ty J. Prosa, Thomas F. Kelly |
| ISBN: | 9781461487210 |
| Publisher: | Springer New York |
| Publication: | December 12, 2013 |
| Imprint: | Springer |
| Language: | English |
This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.
This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.
