Nanoscale CMOS VLSI Circuits: Design for Manufacturability
Nonfiction, Science & Nature, Technology, Electronics, Circuits, Telecommunications
| Author: | Sandip Kundu, Aswin Sreedhar | ISBN: | 9780071635202 |
| Publisher: | McGraw-Hill Education | Publication: | June 22, 2010 |
| Imprint: | McGraw-Hill Education | Language: | English |
| Author: | Sandip Kundu, Aswin Sreedhar |
| ISBN: | 9780071635202 |
| Publisher: | McGraw-Hill Education |
| Publication: | June 22, 2010 |
| Imprint: | McGraw-Hill Education |
| Language: | English |
Cutting-Edge CMOS VLSI Design for Manufacturability Techniques
This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource.
Nanoscale CMOS VLSI Circuits covers:
- Current trends in CMOS VLSI design
- Semiconductor manufacturing technologies
- Photolithography
- Process and device variability: analyses and modeling
- Manufacturing-Aware Physical Design Closure
- Metrology, manufacturing defects, and defect extraction
- Defect impact modeling and yield improvement techniques
- Physical design and reliability
- DFM tools and methodologies
Cutting-Edge CMOS VLSI Design for Manufacturability Techniques
This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource.
Nanoscale CMOS VLSI Circuits covers:
- Current trends in CMOS VLSI design
- Semiconductor manufacturing technologies
- Photolithography
- Process and device variability: analyses and modeling
- Manufacturing-Aware Physical Design Closure
- Metrology, manufacturing defects, and defect extraction
- Defect impact modeling and yield improvement techniques
- Physical design and reliability
- DFM tools and methodologies
