Nanoscale Memory Repair

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Application Software, CAD/CAM
Cover of the book Nanoscale Memory Repair by Masashi Horiguchi, Kiyoo Itoh, Springer New York
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Author: Masashi Horiguchi, Kiyoo Itoh ISBN: 9781441979582
Publisher: Springer New York Publication: January 11, 2011
Imprint: Springer Language: English
Author: Masashi Horiguchi, Kiyoo Itoh
ISBN: 9781441979582
Publisher: Springer New York
Publication: January 11, 2011
Imprint: Springer
Language: English

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.

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Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.

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