Optimum Accelerated Life Testing Models with Time-Varying Stresses
Nonfiction, Science & Nature, Technology, Engineering, Industrial, Mechanical
| Author: | Preeti Wanti Srivastava | ISBN: | 9789813141278 |
| Publisher: | World Scientific Publishing Company | Publication: | February 23, 2017 |
| Imprint: | WSPC | Language: | English |
| Author: | Preeti Wanti Srivastava |
| ISBN: | 9789813141278 |
| Publisher: | World Scientific Publishing Company |
| Publication: | February 23, 2017 |
| Imprint: | WSPC |
| Language: | English |
Today's manufacturers are under tremendous pressure to develop new technological and high reliability products in record time. This has motivated reliability engineers to evaluate the reliabilities of such products. Reliability testing under accelerated environment — accelerated life testing helps to meet this challenge.
This comprehensive and must-have edition provides a broad coverage of the optimal design of Accelerated Life Test Plans under time-varying stress loadings. It also focuses on the formulation of Accelerated Life Test Sampling Plans (ALTSPs) which integrate accelerated life tests with quality control technique of acceptance sampling plans. These plans help to determine optimal experimental variables such as appropriate stress levels, optimal allocation at each stress levels, stress change points, etc, depending on the stress loading scheme. ALTSPs determine optimal plans such that the producers' and consumers' risks are safeguarded.
Contents:
- Different Aspects of ALT Models
- Optimum Step-Stress Accelerated Life Test Models
- Optimum Step-Stress Partially Accelerated Life Test Plans with Type-I and Type-II Censoring
- Optimum Ramp-Stress Fully Accelerated Life Test Plans Under Type-I Censoring
- Optimum Fully Accelerated Life Test Plans with Modified Stress Loading Schemes Under Type-I Censoring
- Optimum Time-Censored Step-Stress Fully ALT with Competing Risks for Failure
- Product Control and Accelerated Life Testing
- Optimum Time-Censored Ramp-Stress ALTSPs
- Optimum Time-Censored Step-Stress PALTSP with Warranty Using Tampered Failure Rate Model
- Optimum Time-Censored Step-Stress PALTSP with Competing Causes of Failure Using Tampered Failure Rate Model
Readership: Researchers, academics, professionals and graduate students in industrial engineering, mechanical engineering, electrical engineering, probability & statistics & operations research.
Today's manufacturers are under tremendous pressure to develop new technological and high reliability products in record time. This has motivated reliability engineers to evaluate the reliabilities of such products. Reliability testing under accelerated environment — accelerated life testing helps to meet this challenge.
This comprehensive and must-have edition provides a broad coverage of the optimal design of Accelerated Life Test Plans under time-varying stress loadings. It also focuses on the formulation of Accelerated Life Test Sampling Plans (ALTSPs) which integrate accelerated life tests with quality control technique of acceptance sampling plans. These plans help to determine optimal experimental variables such as appropriate stress levels, optimal allocation at each stress levels, stress change points, etc, depending on the stress loading scheme. ALTSPs determine optimal plans such that the producers' and consumers' risks are safeguarded.
Contents:
- Different Aspects of ALT Models
- Optimum Step-Stress Accelerated Life Test Models
- Optimum Step-Stress Partially Accelerated Life Test Plans with Type-I and Type-II Censoring
- Optimum Ramp-Stress Fully Accelerated Life Test Plans Under Type-I Censoring
- Optimum Fully Accelerated Life Test Plans with Modified Stress Loading Schemes Under Type-I Censoring
- Optimum Time-Censored Step-Stress Fully ALT with Competing Risks for Failure
- Product Control and Accelerated Life Testing
- Optimum Time-Censored Ramp-Stress ALTSPs
- Optimum Time-Censored Step-Stress PALTSP with Warranty Using Tampered Failure Rate Model
- Optimum Time-Censored Step-Stress PALTSP with Competing Causes of Failure Using Tampered Failure Rate Model
Readership: Researchers, academics, professionals and graduate students in industrial engineering, mechanical engineering, electrical engineering, probability & statistics & operations research.
