Physical Principles of Electron Microscopy
An Introduction to TEM, SEM, and AEM
Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Material Science
| Author: | R.F. Egerton | ISBN: | 9783319398778 |
| Publisher: | Springer International Publishing | Publication: | July 1, 2016 |
| Imprint: | Springer | Language: | English |
| Author: | R.F. Egerton |
| ISBN: | 9783319398778 |
| Publisher: | Springer International Publishing |
| Publication: | July 1, 2016 |
| Imprint: | Springer |
| Language: | English |
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
