Signal Transforms in Dynamic Measurements

Nonfiction, Computers, Advanced Computing, Artificial Intelligence, Science & Nature, Technology, Electronics
Cover of the book Signal Transforms in Dynamic Measurements by Edward Layer, Krzysztof Tomczyk, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Edward Layer, Krzysztof Tomczyk ISBN: 9783319132099
Publisher: Springer International Publishing Publication: December 26, 2014
Imprint: Springer Language: English
Author: Edward Layer, Krzysztof Tomczyk
ISBN: 9783319132099
Publisher: Springer International Publishing
Publication: December 26, 2014
Imprint: Springer
Language: English

This book is devoted to the analysis of measurement signals which requires specific mathematical operations like Convolution, Deconvolution, Laplace, Fourier, Hilbert, Wavelet or Z transform which are all presented in the present book. The different problems refer to the modulation of signals, filtration of disturbance as well as to the orthogonal signals and their use in digital form for the measurement of current, voltage, power and frequency are also widely discussed. All the topics covered in this book are presented in detail and illustrated by means of examples in MathCad and LabVIEW.

This book provides a useful source for researchers, scientists and engineers who in their daily work are required to deal with problems of measurement and signal processing and can also be helpful to undergraduate students of electrical engineering.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book is devoted to the analysis of measurement signals which requires specific mathematical operations like Convolution, Deconvolution, Laplace, Fourier, Hilbert, Wavelet or Z transform which are all presented in the present book. The different problems refer to the modulation of signals, filtration of disturbance as well as to the orthogonal signals and their use in digital form for the measurement of current, voltage, power and frequency are also widely discussed. All the topics covered in this book are presented in detail and illustrated by means of examples in MathCad and LabVIEW.

This book provides a useful source for researchers, scientists and engineers who in their daily work are required to deal with problems of measurement and signal processing and can also be helpful to undergraduate students of electrical engineering.

More books from Springer International Publishing

Cover of the book Representation and Reality in Humans, Other Living Organisms and Intelligent Machines by Edward Layer, Krzysztof Tomczyk
Cover of the book Security in Network Coding by Edward Layer, Krzysztof Tomczyk
Cover of the book Clinical Cardiogenetics by Edward Layer, Krzysztof Tomczyk
Cover of the book Photorefractive Optoelectronic Tweezers and Their Applications by Edward Layer, Krzysztof Tomczyk
Cover of the book Multimodal Location Estimation of Videos and Images by Edward Layer, Krzysztof Tomczyk
Cover of the book Pruritus by Edward Layer, Krzysztof Tomczyk
Cover of the book Youth and Substance Abuse by Edward Layer, Krzysztof Tomczyk
Cover of the book New Trends in Image Analysis and Processing – ICIAP 2017 by Edward Layer, Krzysztof Tomczyk
Cover of the book China, Hong Kong, and the Long 1970s: Global Perspectives by Edward Layer, Krzysztof Tomczyk
Cover of the book Optimized Dark Matter Searches in Deep Observations of Segue 1 with MAGIC by Edward Layer, Krzysztof Tomczyk
Cover of the book Contested Landscapes of Poverty and Homelessness In Southern Europe by Edward Layer, Krzysztof Tomczyk
Cover of the book Controllability, Identification, and Randomness in Distributed Systems by Edward Layer, Krzysztof Tomczyk
Cover of the book Information Search, Integration, and Personalization by Edward Layer, Krzysztof Tomczyk
Cover of the book Bacterial Activation of Type I Interferons by Edward Layer, Krzysztof Tomczyk
Cover of the book Market Microstructure and Nonlinear Dynamics by Edward Layer, Krzysztof Tomczyk
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy