Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Application Software, CAD/CAM
Cover of the book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan, Springer New York
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Hao Yu, Ruijing Shen, Sheldon X.-D. Tan ISBN: 9781461407881
Publisher: Springer New York Publication: July 8, 2014
Imprint: Springer Language: English
Author: Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
ISBN: 9781461407881
Publisher: Springer New York
Publication: July 8, 2014
Imprint: Springer
Language: English

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;

  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;

  • Presents analysis of each algorithm with practical applications in the context of real circuit design;

  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;

  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;

  • Presents analysis of each algorithm with practical applications in the context of real circuit design;

  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. 

More books from Springer New York

Cover of the book TH17 Cells in Health and Disease by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Computational Modeling of Biological Systems by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book High Performance Multi-Channel High-Speed I/O Circuits by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book The Injured Hand by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book The Psychological Impact of Unemployment by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Cancer Associated Viruses by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Modern Issues and Methods in Biostatistics by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Management of Castration Resistant Prostate Cancer by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Plant Mitochondria by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Ethics and Archaeological Praxis by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book The MassGeneral Hospital for Children Adolescent Medicine Handbook by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Opioids, Bulimia, and Alcohol Abuse & Alcoholism by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Mathematical Theories of Distributed Sensor Networks by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Quantitative Genetics in Maize Breeding by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Cover of the book Ten Years of Progress in GW/P Body Research by Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy