Strain and Dislocation Gradients from Diffraction

Spatially-Resolved Local Structure and Defects

Nonfiction, Science & Nature, Science, Biological Sciences, Electron Microscopes & Microscopy, Technology, Material Science

• Author: Rozaliya Barabash, Gene Ice
• ISBN: 9781908979643
• Publisher: World Scientific Publishing Company
• Publication: March 20, 2014
• Imprint: ICP
• Language: English

This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.

Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Contents:

• Diffraction Analysis of Defects: State of the Art (Rozaliya I Barabash and Gene E Ice)
• X-ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source (Wenjun Liu and Gene E Ice)
• High-Energy Transmission Laue (HETL) Micro-Beam Diffraction (Felix Hofmann and Alexander M Korsunsky)
• XMAS: A Versatile Tool for Analyzing Synchrotron X-ray Microdiffraction Data (Nobumichi Tamura)
• Laue Microdiffraction at the ESRF (Odile Robach, Christoph Kirchlechner, Jean-Sébastien Micha, Olivier Ulrich, Xavier Biquard, Olivier Geaymond, Olivier Castelnau, Michel Bornert, Johann Petit, Sophie Berveiller, Olivier Sicardy, Julie Villanova and François Rieutord)
• 3D X-Ray Diffraction Microscopy (Henning Friis Poulsen, Søren Schmidt, Dorte Juul Jensen, Henning Osholm Sørensen, Erik Mejdal Lauridsen, Ulrik Lund Olsen, Wolfgang Ludwig, Andrew King, Jonathan Paul Wright and Gavin B M Vaughan)
• Grain Centre Mapping — 3DXRD Measurements of Average Grain Characteristic (Jette Oddershede, Søren Schmidt, Allan Lyckegaard, Erik Mejdal Lauridsen, Jonathan Paul Wright and Grethe Winther)
• Three-Dimensional X-ray Diffraction (3DXRD) Imaging Techniques (Wolfgang Ludwig, Andrew King and Péter Reischig)
• High-Resolution Reciprocal Space Mapping for Characterizing Deformation Structures (Wolfgang Pantleon, Christian Wejdemann, Bo Jakobsen, Henning Friis Poulsen and Ulrich Lienert)
• Reconstructing 2D and 3D X-ray Orientation Maps from White-Beam Laue (Jonathan Z Tischler)
• Energy-Variable X-ray Diffraction for Studying Polycrystalline Materials with High Depth Resolution (Emil Zolotoyabko)
• Microstructure Detail Extraction via EBSD: An Overview (David Fullwood, Brent Adams, Jay Basinger, Timothy Ruggles, Ali Khosravani, Caroline Sorensen and Joshua Kacher)
• High-Pressure Studies with Microdiffraction (Wenge Yang)

Readership: Researchers in X-ray science, materials science, applied physics, and mechanical engineering.
Key Features:

• The book addresses the following three questions: what is the current state-of-the-art in this field; what are the advantages, capabilities and limitations of competing methods; what are the practical tools needed for spatially-resolved diffraction methods