Thermal-Aware Testing of Digital VLSI Circuits and Systems
Nonfiction, Science & Nature, Technology, Electronics, Microelectronics, Circuits
| Author: | Santanu Chattopadhyay | ISBN: | 9781351227766 |
| Publisher: | CRC Press | Publication: | April 24, 2018 |
| Imprint: | CRC Press | Language: | English |
| Author: | Santanu Chattopadhyay |
| ISBN: | 9781351227766 |
| Publisher: | CRC Press |
| Publication: | April 24, 2018 |
| Imprint: | CRC Press |
| Language: | English |
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
