Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

Nonfiction, Computers, Advanced Computing, Artificial Intelligence, General Computing
Cover of the book Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods by Chris Aldrich, Lidia Auret, Springer London
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Author: Chris Aldrich, Lidia Auret ISBN: 9781447151852
Publisher: Springer London Publication: June 15, 2013
Imprint: Springer Language: English
Author: Chris Aldrich, Lidia Auret
ISBN: 9781447151852
Publisher: Springer London
Publication: June 15, 2013
Imprint: Springer
Language: English

This unique text/reference describes in detail the latest advances in unsupervised process monitoring and fault diagnosis with machine learning methods. Abundant case studies throughout the text demonstrate the efficacy of each method in real-world settings. The broad coverage examines such cutting-edge topics as the use of information theory to enhance unsupervised learning in tree-based methods, the extension of kernel methods to multiple kernel learning for feature extraction from data, and the incremental training of multilayer perceptrons to construct deep architectures for enhanced data projections. Topics and features: discusses machine learning frameworks based on artificial neural networks, statistical learning theory and kernel-based methods, and tree-based methods; examines the application of machine learning to steady state and dynamic operations, with a focus on unsupervised learning; describes the use of spectral methods in process fault diagnosis.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This unique text/reference describes in detail the latest advances in unsupervised process monitoring and fault diagnosis with machine learning methods. Abundant case studies throughout the text demonstrate the efficacy of each method in real-world settings. The broad coverage examines such cutting-edge topics as the use of information theory to enhance unsupervised learning in tree-based methods, the extension of kernel methods to multiple kernel learning for feature extraction from data, and the incremental training of multilayer perceptrons to construct deep architectures for enhanced data projections. Topics and features: discusses machine learning frameworks based on artificial neural networks, statistical learning theory and kernel-based methods, and tree-based methods; examines the application of machine learning to steady state and dynamic operations, with a focus on unsupervised learning; describes the use of spectral methods in process fault diagnosis.

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