VLSI Design and Test
21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Nonfiction, Computers, Advanced Computing, Engineering, Computer Architecture, Computer Hardware, Input-Output Equipment, General Computing
| Author: | ISBN: | 9789811074707 | |
| Publisher: | Springer Singapore | Publication: | December 21, 2017 |
| Imprint: | Springer | Language: | English |
| Author: | |
| ISBN: | 9789811074707 |
| Publisher: | Springer Singapore |
| Publication: | December 21, 2017 |
| Imprint: | Springer |
| Language: | English |
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
