X-Ray Diffraction by Polycrystalline Materials

Nonfiction, Science & Nature, Technology, Material Science
Cover of the book X-Ray Diffraction by Polycrystalline Materials by René Guinebretière, Wiley
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: René Guinebretière ISBN: 9781118613955
Publisher: Wiley Publication: March 1, 2013
Imprint: Wiley-ISTE Language: English
Author: René Guinebretière
ISBN: 9781118613955
Publisher: Wiley
Publication: March 1, 2013
Imprint: Wiley-ISTE
Language: English

This book presents a physical approach to the diffraction phenomenon and its applications in materials science.

An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.

Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book presents a physical approach to the diffraction phenomenon and its applications in materials science.

An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.

Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

More books from Wiley

Cover of the book Home Recording For Musicians For Dummies by René Guinebretière
Cover of the book Win / Loss Reviews by René Guinebretière
Cover of the book Design of Steel Structures by René Guinebretière
Cover of the book Fundamentals of Infrared and Visible Detector Operation and Testing by René Guinebretière
Cover of the book Fundamentals of Calculus by René Guinebretière
Cover of the book Partners in Advancing Student Learning: Degree Qualifications Profile and Tuning by René Guinebretière
Cover of the book The Blended Workbook by René Guinebretière
Cover of the book Executing Your Business Transformation by René Guinebretière
Cover of the book Legislators and Interpreters by René Guinebretière
Cover of the book The 2010 Pfeiffer Annual by René Guinebretière
Cover of the book Suggestibility in Legal Contexts by René Guinebretière
Cover of the book Telemedicine Technologies by René Guinebretière
Cover of the book The Photophysics behind Photovoltaics and Photonics by René Guinebretière
Cover of the book European Handbook of Neurological Management by René Guinebretière
Cover of the book Grounding Globalization by René Guinebretière
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy