X-Ray Diffraction by Polycrystalline Materials

Nonfiction, Science & Nature, Technology, Material Science
Cover of the book X-Ray Diffraction by Polycrystalline Materials by René Guinebretière, Wiley
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: René Guinebretière ISBN: 9781118613955
Publisher: Wiley Publication: March 1, 2013
Imprint: Wiley-ISTE Language: English
Author: René Guinebretière
ISBN: 9781118613955
Publisher: Wiley
Publication: March 1, 2013
Imprint: Wiley-ISTE
Language: English

This book presents a physical approach to the diffraction phenomenon and its applications in materials science.

An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.

Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book presents a physical approach to the diffraction phenomenon and its applications in materials science.

An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.

Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

More books from Wiley

Cover of the book Facilities Manager's Desk Reference by René Guinebretière
Cover of the book Current and Future Issues in Hemophilia Care by René Guinebretière
Cover of the book Cascade Biocatalysis by René Guinebretière
Cover of the book IT-Driven Business Models by René Guinebretière
Cover of the book Onychomycosis by René Guinebretière
Cover of the book Getting a Networking Job For Dummies by René Guinebretière
Cover of the book International Handbook of Workplace Trauma Support by René Guinebretière
Cover of the book The Practice of Professional Consulting by René Guinebretière
Cover of the book Hijacking America by René Guinebretière
Cover of the book Samsung Galaxy Tab 10.1 For Dummies by René Guinebretière
Cover of the book Christianity by René Guinebretière
Cover of the book AWS For Admins For Dummies by René Guinebretière
Cover of the book Managing Risks in Commercial and Retail Banking by René Guinebretière
Cover of the book Hemostasis and Thrombosis in Obstetrics and Gynecology by René Guinebretière
Cover of the book Participatory Culture in a Networked Era by René Guinebretière
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy