X-Ray Line Profile Analysis in Materials Science

Nonfiction, Science & Nature, Science, Chemistry, Crystallography, Technology, Material Science
Cover of the book X-Ray Line Profile Analysis in Materials Science by Jenő Gubicza, IGI Global
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Author: Jenő Gubicza ISBN: 9781466658547
Publisher: IGI Global Publication: March 31, 2014
Imprint: Engineering Science Reference Language: English
Author: Jenő Gubicza
ISBN: 9781466658547
Publisher: IGI Global
Publication: March 31, 2014
Imprint: Engineering Science Reference
Language: English

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

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