Seiji Samukawa: 1 book

Book cover of Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
by Seiji Samukawa
Language: English
Release Date: January 28, 2014

This book provides for the first time a good understanding of the etching profile technologies that do not disturb the plasma. Three types of sensors are introduced: on-wafer UV sensors, on-wafer charge-up sensors and on-wafer sheath-shape sensors in the plasma processing and prediction system of...
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