by
Khaled Salah, Yehea Ismail, Alaa El-Rouby
Language: English
Release Date: August 21, 2014
This book presents a wide-band and technology independent, SPICE-compatible RLC model for through-silicon vias (TSVs) in 3D integrated circuits. This model accounts for a variety of effects, including skin effect, depletion capacitance and nearby contact effects. Readers will benefit from in-depth...