Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features

Nonfiction, Health & Well Being, Medical, Specialties, Pathology
Cover of the book Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features by Von G. Samedi, Thèrése Bocklage, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Von G. Samedi, Thèrése Bocklage ISBN: 9783319398099
Publisher: Springer International Publishing Publication: September 22, 2016
Imprint: Springer Language: English
Author: Von G. Samedi, Thèrése Bocklage
ISBN: 9783319398099
Publisher: Springer International Publishing
Publication: September 22, 2016
Imprint: Springer
Language: English

This book provides cytopathologists a succinct but comprehensive reference covering common diagnostic dilemmas caused by normal, iatrogenic, inflammatory and reactive/reparative changes in cytology samples. This book will provide immediate access to these confounders, clearly illustrating key features and detailing the pitfalls these cells engender in all cytologically accessible body sites.  The text is organized in chapters corresponding to cytologically accessible body sites/organ systems.  Each chapter’s discussions are further organized by general categories of confounders (i.e., normal contaminants, inflammatory, infectious and iatrogenic), with special attention to site specific confounders.       

Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features will be of great value to practicing pathologists, pathology residents, cytopathology fellows, cytotechnology technologists and students. 

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides cytopathologists a succinct but comprehensive reference covering common diagnostic dilemmas caused by normal, iatrogenic, inflammatory and reactive/reparative changes in cytology samples. This book will provide immediate access to these confounders, clearly illustrating key features and detailing the pitfalls these cells engender in all cytologically accessible body sites.  The text is organized in chapters corresponding to cytologically accessible body sites/organ systems.  Each chapter’s discussions are further organized by general categories of confounders (i.e., normal contaminants, inflammatory, infectious and iatrogenic), with special attention to site specific confounders.       

Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features will be of great value to practicing pathologists, pathology residents, cytopathology fellows, cytotechnology technologists and students. 

More books from Springer International Publishing

Cover of the book Computer Networks by Von G. Samedi, Thèrése Bocklage
Cover of the book Silvopastoral Systems in Southern South America by Von G. Samedi, Thèrése Bocklage
Cover of the book Trust and Legitimacy in Criminal Justice by Von G. Samedi, Thèrése Bocklage
Cover of the book Tunneling Dynamics in Open Ultracold Bosonic Systems by Von G. Samedi, Thèrése Bocklage
Cover of the book Global Formulations of Lagrangian and Hamiltonian Dynamics on Manifolds by Von G. Samedi, Thèrése Bocklage
Cover of the book Artificial Intelligence in Education by Von G. Samedi, Thèrése Bocklage
Cover of the book Women's Reproductive Mental Health Across the Lifespan by Von G. Samedi, Thèrése Bocklage
Cover of the book The Governance of Smart Transportation Systems by Von G. Samedi, Thèrése Bocklage
Cover of the book Research and Development in Digital Media by Von G. Samedi, Thèrése Bocklage
Cover of the book Nonparametric Statistics by Von G. Samedi, Thèrése Bocklage
Cover of the book Guide to Computing Fundamentals in Cyber-Physical Systems by Von G. Samedi, Thèrése Bocklage
Cover of the book Evaluating Employee Performance through Christian Virtues by Von G. Samedi, Thèrése Bocklage
Cover of the book Popigai Impact Structure and its Diamond-Bearing Rocks by Von G. Samedi, Thèrése Bocklage
Cover of the book Explorations in the History of Machines and Mechanisms by Von G. Samedi, Thèrése Bocklage
Cover of the book Reflected Brownian Motions in the KPZ Universality Class by Von G. Samedi, Thèrése Bocklage
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy