Spectroscopy of Complex Oxide Interfaces

Photoemission and Related Spectroscopies

Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Material Science
Cover of the book Spectroscopy of Complex Oxide Interfaces by , Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9783319749891
Publisher: Springer International Publishing Publication: April 9, 2018
Imprint: Springer Language: English
Author:
ISBN: 9783319749891
Publisher: Springer International Publishing
Publication: April 9, 2018
Imprint: Springer
Language: English

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. 

The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. 

The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.

More books from Springer International Publishing

Cover of the book Fractional-order Modeling and Control of Dynamic Systems by
Cover of the book Smart Organizations and Smart Artifacts by
Cover of the book Challenges in Mechanics of Time Dependent Materials, Volume 2 by
Cover of the book Mesoscopic Theories of Heat Transport in Nanosystems by
Cover of the book Algorithms for Sparsity-Constrained Optimization by
Cover of the book Hollyweird Science by
Cover of the book Spaceplane HERMES by
Cover of the book Advances in Cryptology – CRYPTO 2018 by
Cover of the book Communication and Economic Theory by
Cover of the book TRP Channels in Sensory Transduction by
Cover of the book Anthrozoology by
Cover of the book Evolutionary Bioinformatics by
Cover of the book Proceedings of First International Conference on Information and Communication Technology for Intelligent Systems: Volume 1 by
Cover of the book Biological Robustness by
Cover of the book Digital Workplace Learning by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy