Spectroscopy of Complex Oxide Interfaces

Photoemission and Related Spectroscopies

Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Material Science
Cover of the book Spectroscopy of Complex Oxide Interfaces by , Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9783319749891
Publisher: Springer International Publishing Publication: April 9, 2018
Imprint: Springer Language: English
Author:
ISBN: 9783319749891
Publisher: Springer International Publishing
Publication: April 9, 2018
Imprint: Springer
Language: English

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. 

The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. 

The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.

More books from Springer International Publishing

Cover of the book Land and Credit by
Cover of the book Foreign Aid and the Future of Africa by
Cover of the book Astrobiology and Society in Europe Today by
Cover of the book Excel 2013 for Human Resource Management Statistics by
Cover of the book Advances in Intelligent Informatics, Smart Technology and Natural Language Processing by
Cover of the book Validity and Validation in Social, Behavioral, and Health Sciences by
Cover of the book The Map and the Territory by
Cover of the book Information Systems in the Big Data Era by
Cover of the book Mesoscopic Theories of Heat Transport in Nanosystems by
Cover of the book Mathematical Foundations of Time Series Analysis by
Cover of the book Fixed Income Analytics by
Cover of the book e-Health Care in Dentistry and Oral Medicine by
Cover of the book Christian Ethics and Corporate Culture by
Cover of the book Applications in Electronics Pervading Industry, Environment and Society by
Cover of the book Fair Development in China by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy